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Oxford Intruments Exhibition

Oxford Instruments Asylum Research is the Technology Leading Manufacturer for Atomic Force Microscopy (AFM), which provides you a high-resolution imaging technique that uses a small probe to scan surfaces of materials to provide 3D height information – a landscape. We develop higher performance AFMs (eg resolution, speed), more useful AFMs (eg going beyond topography, extending to mechanical, electrical, and functional properties), and easier to use AFMs (eg eliminating artifacts, automating setup, making operation more consistent and predictable). 

    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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